Fixed defect detected by static analysis tool 33/93033/2 accepted/tizen/common/20161031.121845 accepted/tizen/wearable/20161101.004731 submit/tizen/20161031.051052
authorJi-hoon Lee <dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:08:54 +0000 (15:08 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:19:53 +0000 (15:19 +0900)
Change-Id: I5c3acc19e4478b2c3421b68b203b0a5e08f1bb16

src/MicEffector.cpp

index f2602d1..9010026 100755 (executable)
@@ -408,7 +408,8 @@ void MicEffector::VolumeCheck(bool fake)
                volumes = ieffect.GetVolume();
        } else {
                for(unsigned int i = 0; i < spectrum_count; i++) {
-                       volumes.push_back(rand_r((unsigned int*)time(NULL)) % 2);
+                       unsigned int seed = time(NULL);
+                       volumes.push_back(rand_r(&seed) % 2);
                }
        }