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Fixed defect detected by static analysis tool
33/93033/2
accepted/tizen/common/20161031.121845
accepted/tizen/wearable/20161101.004731
submit/tizen/20161031.051052
author
Ji-hoon Lee
<dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:08:54 +0000
(15:08 +0900)
committer
Ji-hoon Lee
<dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:19:53 +0000
(15:19 +0900)
Change-Id: I5c3acc19e4478b2c3421b68b203b0a5e08f1bb16
src/MicEffector.cpp
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diff --git
a/src/MicEffector.cpp
b/src/MicEffector.cpp
index
f2602d1
..
9010026
100755
(executable)
--- a/
src/MicEffector.cpp
+++ b/
src/MicEffector.cpp
@@
-408,7
+408,8
@@
void MicEffector::VolumeCheck(bool fake)
volumes = ieffect.GetVolume();
} else {
for(unsigned int i = 0; i < spectrum_count; i++) {
volumes = ieffect.GetVolume();
} else {
for(unsigned int i = 0; i < spectrum_count; i++) {
- volumes.push_back(rand_r((unsigned int*)time(NULL)) % 2);
+ unsigned int seed = time(NULL);
+ volumes.push_back(rand_r(&seed) % 2);
}
}
}
}