transient_for_below: fix bug of below_lower2 test 79/261479/1
authorDoyoun Kang <doyoun.kang@samsung.com>
Tue, 20 Jul 2021 02:25:51 +0000 (11:25 +0900)
committerDoyoun Kang <doyoun.kang@samsung.com>
Tue, 20 Jul 2021 02:25:51 +0000 (11:25 +0900)
Change-Id: I8aa321dd4ef58bc6c758624ee98dda13d79a5cc1

src/testcase/0014_transient_for_below.cpp [changed mode: 0755->0644]

old mode 100755 (executable)
new mode 100644 (file)
index 8ee5462..d63693b
@@ -303,9 +303,9 @@ TEST_F(etTestTransientForBelow, transient_for_below_lower2)
    // Expected stack res:
    // [Top] tw_parent -> tw_child -> tw_child2 -> tw_base [Bottom]
 
-   // Lower tw_child2
+   // Lower tw_child
    etRunner::get().setWinStack(tw_child, NULL, EINA_FALSE);
-   ASSERT_EVENT(tw_child2, E_TC_EVENT_TYPE_STACK_LOWER);
+   ASSERT_EVENT(tw_child, E_TC_EVENT_TYPE_STACK_BELOW);
 
    // Expected stack res:
    // [Top] tw_parent -> tw_child2 -> tw_child -> tw_base [Bottom]