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(parent: 7545661) | patch
Fix memory corruption in unittest 63/183363/2
authorTaesoo Jun <steve.jun@samsung.com>
Thu, 5 Jul 2018 01:47:01 +0000 (10:47 +0900)
committerTaesoo Jun <steve.jun@samsung.com>
Thu, 5 Jul 2018 02:04:12 +0000 (02:04 +0000)
commitc7ff50e805d4cb381bd72dff2c69a3ef41efe558
tree6ebf90b946db49ffab4b4033f7a5d3801adba4aftree | snapshot
parent7545661a1bd62733bb4334e630b84bbf64ffdfe0commit | diff
Fix memory corruption in unittest

Change-Id: I075961d576735dd852939a70b276c1adbcd9a65a
Signed-off-by: Taesoo Jun <steve.jun@samsung.com>
gtest/unittest.cpp diff | blob | history
Domain: Network & Connectivity / Data Network;