transient_for_below: fix bug of below_lower2 test 79/261479/1
authorDoyoun Kang <doyoun.kang@samsung.com>
Tue, 20 Jul 2021 02:25:51 +0000 (11:25 +0900)
committerDoyoun Kang <doyoun.kang@samsung.com>
Tue, 20 Jul 2021 02:25:51 +0000 (11:25 +0900)
commita9fb12f2dbcdfe886068c0469077fe8dd1204333
tree3e389fda8d6c591e4836386721b3eb74dc54612f
parent7072a4d453b6737c39e1f3ef8de9e3e7323a424d
transient_for_below: fix bug of below_lower2 test

Change-Id: I8aa321dd4ef58bc6c758624ee98dda13d79a5cc1
src/testcase/0014_transient_for_below.cpp [changed mode: 0755->0644]