Fixed defects detected by static analysis tool 54/172354/1
authorJi-hoon Lee <dalton.lee@samsung.com>
Tue, 13 Mar 2018 10:05:31 +0000 (19:05 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Tue, 13 Mar 2018 10:05:31 +0000 (19:05 +0900)
commit256458baa99414f6ba733d588871e9a4292692c5
tree725a4b2baadd7c58369c075f9b7c5117874bd8de
parentf60980f6a779fc8a3a3d3bad520468b40300017b
Fixed defects detected by static analysis tool

Change-Id: I84217307b8b2c4a43b58b333351e3f1703467bc5
src/sclconnection-isf.cpp
src/sclcoreui-efl.cpp