ODE API negative tests: keys 46/168846/15
authorPawel Kowalski <p.kowalski2@partner.samsung.com>
Tue, 30 Jan 2018 13:07:02 +0000 (14:07 +0100)
committerPawel Kowalski <p.kowalski2@partner.samsung.com>
Mon, 25 Jun 2018 08:59:12 +0000 (10:59 +0200)
commitdcbc576c55c741c3cf0d2a44fab2a815fc6a48b2
tree4c8943cea7db6929cad2ef545a61c7d84aca49c7
parente511b2b9733b7531fde0b9fd0bf52bafddc862ca
ODE API negative tests: keys

Change-Id: I7fc7d6dc987aa94ae39657c728a6ac7394ae03de
src/ode/CMakeLists.txt
src/ode/ode-tests-common.cpp [new file with mode: 0644]
src/ode/ode-tests-common.h [new file with mode: 0644]
src/ode/ode-tests-external-encryption.cpp
src/ode/ode-tests-internal-encryption.cpp
src/ode/ode-tests-keys.cpp
src/ode/ode-tests-luks.cpp
src/ode/ode-tests-secure-erase.cpp
src/ode/ode-tests.cpp