From a9fb12f2dbcdfe886068c0469077fe8dd1204333 Mon Sep 17 00:00:00 2001
From: Doyoun Kang <doyoun.kang@samsung.com>
Date: Tue, 20 Jul 2021 11:25:51 +0900
Subject: [PATCH] transient_for_below: fix bug of below_lower2 test

Change-Id: I8aa321dd4ef58bc6c758624ee98dda13d79a5cc1
---
 src/testcase/0014_transient_for_below.cpp | 4 ++--
 1 file changed, 2 insertions(+), 2 deletions(-)
 mode change 100755 => 100644 src/testcase/0014_transient_for_below.cpp

diff --git a/src/testcase/0014_transient_for_below.cpp b/src/testcase/0014_transient_for_below.cpp
old mode 100755
new mode 100644
index 8ee5462..d63693b
--- a/src/testcase/0014_transient_for_below.cpp
+++ b/src/testcase/0014_transient_for_below.cpp
@@ -303,9 +303,9 @@ TEST_F(etTestTransientForBelow, transient_for_below_lower2)
    // Expected stack res:
    // [Top] tw_parent -> tw_child -> tw_child2 -> tw_base [Bottom]
 
-   // Lower tw_child2
+   // Lower tw_child
    etRunner::get().setWinStack(tw_child, NULL, EINA_FALSE);
-   ASSERT_EVENT(tw_child2, E_TC_EVENT_TYPE_STACK_LOWER);
+   ASSERT_EVENT(tw_child, E_TC_EVENT_TYPE_STACK_BELOW);
 
    // Expected stack res:
    // [Top] tw_parent -> tw_child2 -> tw_child -> tw_base [Bottom]
-- 
2.7.4