From 7beb37e5f0d29d7d23aec0e47900ff4dfa8c2e55 Mon Sep 17 00:00:00 2001 From: Boris Brezillon Date: Sun, 4 Nov 2018 14:50:28 +0100 Subject: [PATCH] mtd: rawnand: Use nanddev_mtd_max_bad_blocks() nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer and is already doing what we need. Reuse this function instead of having our own implementation. While at it, get rid of the ->max_bb_per_die and ->blocks_per_die fields which are now unused. Signed-off-by: Boris Brezillon Signed-off-by: Miquel Raynal Reviewed-by: Frieder Schrempf --- drivers/mtd/nand/raw/nand_base.c | 38 +------------------------------------- drivers/mtd/nand/raw/nand_onfi.c | 3 --- include/linux/mtd/rawnand.h | 5 ----- 3 files changed, 1 insertion(+), 45 deletions(-) diff --git a/drivers/mtd/nand/raw/nand_base.c b/drivers/mtd/nand/raw/nand_base.c index 26aeea0..035b9cf 100644 --- a/drivers/mtd/nand/raw/nand_base.c +++ b/drivers/mtd/nand/raw/nand_base.c @@ -4298,42 +4298,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs) } /** - * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd - * @mtd: MTD device structure - * @ofs: offset relative to mtd start - * @len: length of mtd - */ -static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len) -{ - struct nand_chip *chip = mtd_to_nand(mtd); - u32 part_start_block; - u32 part_end_block; - u32 part_start_die; - u32 part_end_die; - - /* - * max_bb_per_die and blocks_per_die used to determine - * the maximum bad block count. - */ - if (!chip->max_bb_per_die || !chip->blocks_per_die) - return -ENOTSUPP; - - /* Get the start and end of the partition in erase blocks. */ - part_start_block = mtd_div_by_eb(ofs, mtd); - part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1; - - /* Get the start and end LUNs of the partition. */ - part_start_die = part_start_block / chip->blocks_per_die; - part_end_die = part_end_block / chip->blocks_per_die; - - /* - * Look up the bad blocks per unit and multiply by the number of units - * that the partition spans. - */ - return chip->max_bb_per_die * (part_end_die - part_start_die + 1); -} - -/** * nand_suspend - [MTD Interface] Suspend the NAND flash * @mtd: MTD device structure */ @@ -5819,7 +5783,7 @@ static int nand_scan_tail(struct nand_chip *chip) mtd->_block_isreserved = nand_block_isreserved; mtd->_block_isbad = nand_block_isbad; mtd->_block_markbad = nand_block_markbad; - mtd->_max_bad_blocks = nand_max_bad_blocks; + mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks; /* * Initialize bitflip_threshold to its default prior scan_bbt() call. diff --git a/drivers/mtd/nand/raw/nand_onfi.c b/drivers/mtd/nand/raw/nand_onfi.c index f3f59cf..3ca9c89 100644 --- a/drivers/mtd/nand/raw/nand_onfi.c +++ b/drivers/mtd/nand/raw/nand_onfi.c @@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip) memorg->bits_per_cell = p->bits_per_cell; chip->bits_per_cell = p->bits_per_cell; - chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun); - chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun); - if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS) chip->options |= NAND_BUSWIDTH_16; diff --git a/include/linux/mtd/rawnand.h b/include/linux/mtd/rawnand.h index 99250dc..9d0cdae 100644 --- a/include/linux/mtd/rawnand.h +++ b/include/linux/mtd/rawnand.h @@ -1015,9 +1015,6 @@ struct nand_legacy { * @id: [INTERN] holds NAND ID * @parameters: [INTERN] holds generic parameters under an easily * readable form. - * @max_bb_per_die: [INTERN] the max number of bad blocks each die of a - * this nand device will encounter their life times. - * @blocks_per_die: [INTERN] The number of PEBs in a die * @data_interface: [INTERN] NAND interface timing information * @cur_cs: currently selected target. -1 means no target selected, * otherwise we should always have cur_cs >= 0 && @@ -1076,8 +1073,6 @@ struct nand_chip { struct nand_id id; struct nand_parameters parameters; - u16 max_bb_per_die; - u32 blocks_per_die; struct nand_data_interface data_interface; -- 2.7.4