From: Aaro Koskinen Date: Thu, 10 Oct 2013 20:25:27 +0000 (+0300) Subject: staging: octeon-usb: delete unused cvmx_usbnx_usbp_ctl_status definitions X-Git-Tag: v3.13-rc1~170^2~313 X-Git-Url: http://review.tizen.org/git/?a=commitdiff_plain;h=d8d8e148fd1176fe5ac496478afe4efb67435ae1;p=kernel%2Fkernel-generic.git staging: octeon-usb: delete unused cvmx_usbnx_usbp_ctl_status definitions cvmx_usbnx_usbp_ctl_status was multiplied for different OCTEONS and all those definitions are unused. Delete them. Signed-off-by: Aaro Koskinen Signed-off-by: Greg Kroah-Hartman --- diff --git a/drivers/staging/octeon-usb/cvmx-usbnx-defs.h b/drivers/staging/octeon-usb/cvmx-usbnx-defs.h index e06aafa..c73df64 100644 --- a/drivers/staging/octeon-usb/cvmx-usbnx-defs.h +++ b/drivers/staging/octeon-usb/cvmx-usbnx-defs.h @@ -498,388 +498,6 @@ union cvmx_usbnx_usbp_ctl_status { uint64_t tdata_in : 8; uint64_t ate_reset : 1; } s; - /** - * struct cvmx_usbnx_usbp_ctl_status_cn30xx - * @bist_done: PHY Bist Done. - * Asserted at the end of the PHY BIST sequence. - * @bist_err: PHY Bist Error. - * Indicates an internal error was detected during - * the BIST sequence. - * @tdata_out: PHY Test Data Out. - * Presents either internaly generated signals or - * test register contents, based upon the value of - * test_data_out_sel. - * @dma_bmode: When set to 1 the L2C DMA address will be updated - * with byte-counts between packets. When set to 0 - * the L2C DMA address is incremented to the next - * 4-byte aligned address after adding byte-count. - * @usbc_end: Bigendian input to the USB Core. This should be - * set to '0' for operation. - * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP. - * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP. - * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D+ line. '1' pull down-resistance is connected - * to D+/ '0' pull down resistance is not connected - * to D+. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D- line. '1' pull down-resistance is connected - * to D-. '0' pull down resistance is not connected - * to D-. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @hst_mode: When '0' the USB is acting as HOST, when '1' - * USB is acting as device. This field needs to be - * set while the USB is in reset. - * @tuning: Transmitter Tuning for High-Speed Operation. - * Tunes the current supply and rise/fall output - * times for high-speed operation. - * [20:19] == 11: Current supply increased - * approximately 9% - * [20:19] == 10: Current supply increased - * approximately 4.5% - * [20:19] == 01: Design default. - * [20:19] == 00: Current supply decreased - * approximately 4.5% - * [22:21] == 11: Rise and fall times are increased. - * [22:21] == 10: Design default. - * [22:21] == 01: Rise and fall times are decreased. - * [22:21] == 00: Rise and fall times are decreased - * further as compared to the 01 setting. - * @tx_bs_enh: Transmit Bit Stuffing on [15:8]. - * Enables or disables bit stuffing on data[15:8] - * when bit-stuffing is enabled. - * @tx_bs_en: Transmit Bit Stuffing on [7:0]. - * Enables or disables bit stuffing on data[7:0] - * when bit-stuffing is enabled. - * @loop_enb: PHY Loopback Test Enable. - * '1': During data transmission the receive is - * enabled. - * '0': During data transmission the receive is - * disabled. - * Must be '0' for normal operation. - * @vtest_enb: Analog Test Pin Enable. - * '1' The PHY's analog_test pin is enabled for the - * input and output of applicable analog test signals. - * '0' THe analog_test pin is disabled. - * @bist_enb: Built-In Self Test Enable. - * Used to activate BIST in the PHY. - * @tdata_sel: Test Data Out Select. - * '1' test_data_out[3:0] (PHY) register contents - * are output. '0' internaly generated signals are - * output. - * @taddr_in: Mode Address for Test Interface. - * Specifies the register address for writing to or - * reading from the PHY test interface register. - * @tdata_in: Internal Testing Register Input Data and Select - * This is a test bus. Data is present on [3:0], - * and its corresponding select (enable) is present - * on bits [7:4]. - * @ate_reset: Reset input from automatic test equipment. - * This is a test signal. When the USB Core is - * powered up (not in Susned Mode), an automatic - * tester can use this to disable phy_clock and - * free_clk, then re-eanable them with an aligned - * phase. - * '1': The phy_clk and free_clk outputs are - * disabled. "0": The phy_clock and free_clk outputs - * are available within a specific period after the - * de-assertion. - */ - struct cvmx_usbnx_usbp_ctl_status_cn30xx { - uint64_t reserved_38_63 : 26; - uint64_t bist_done : 1; - uint64_t bist_err : 1; - uint64_t tdata_out : 4; - uint64_t reserved_30_31 : 2; - uint64_t dma_bmode : 1; - uint64_t usbc_end : 1; - uint64_t usbp_bist : 1; - uint64_t tclk : 1; - uint64_t dp_pulld : 1; - uint64_t dm_pulld : 1; - uint64_t hst_mode : 1; - uint64_t tuning : 4; - uint64_t tx_bs_enh : 1; - uint64_t tx_bs_en : 1; - uint64_t loop_enb : 1; - uint64_t vtest_enb : 1; - uint64_t bist_enb : 1; - uint64_t tdata_sel : 1; - uint64_t taddr_in : 4; - uint64_t tdata_in : 8; - uint64_t ate_reset : 1; - } cn30xx; - /** - * struct cvmx_usbnx_usbp_ctl_status_cn50xx - * @txrisetune: HS Transmitter Rise/Fall Time Adjustment - * @txvreftune: HS DC Voltage Level Adjustment - * @txfslstune: FS/LS Source Impedence Adjustment - * @txhsxvtune: Transmitter High-Speed Crossover Adjustment - * @sqrxtune: Squelch Threshold Adjustment - * @compdistune: Disconnect Threshold Adjustment - * @otgtune: VBUS Valid Threshold Adjustment - * @otgdisable: OTG Block Disable - * @portreset: Per_Port Reset - * @drvvbus: Drive VBUS - * @lsbist: Low-Speed BIST Enable. - * @fsbist: Full-Speed BIST Enable. - * @hsbist: High-Speed BIST Enable. - * @bist_done: PHY Bist Done. - * Asserted at the end of the PHY BIST sequence. - * @bist_err: PHY Bist Error. - * Indicates an internal error was detected during - * the BIST sequence. - * @tdata_out: PHY Test Data Out. - * Presents either internaly generated signals or - * test register contents, based upon the value of - * test_data_out_sel. - * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable - * @dma_bmode: When set to 1 the L2C DMA address will be updated - * with byte-counts between packets. When set to 0 - * the L2C DMA address is incremented to the next - * 4-byte aligned address after adding byte-count. - * @usbc_end: Bigendian input to the USB Core. This should be - * set to '0' for operation. - * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP. - * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP. - * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D+ line. '1' pull down-resistance is connected - * to D+/ '0' pull down resistance is not connected - * to D+. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D- line. '1' pull down-resistance is connected - * to D-. '0' pull down resistance is not connected - * to D-. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @hst_mode: When '0' the USB is acting as HOST, when '1' - * USB is acting as device. This field needs to be - * set while the USB is in reset. - * @tx_bs_enh: Transmit Bit Stuffing on [15:8]. - * Enables or disables bit stuffing on data[15:8] - * when bit-stuffing is enabled. - * @tx_bs_en: Transmit Bit Stuffing on [7:0]. - * Enables or disables bit stuffing on data[7:0] - * when bit-stuffing is enabled. - * @loop_enb: PHY Loopback Test Enable. - * '1': During data transmission the receive is - * enabled. - * '0': During data transmission the receive is - * disabled. - * Must be '0' for normal operation. - * @vtest_enb: Analog Test Pin Enable. - * '1' The PHY's analog_test pin is enabled for the - * input and output of applicable analog test signals. - * '0' THe analog_test pin is disabled. - * @bist_enb: Built-In Self Test Enable. - * Used to activate BIST in the PHY. - * @tdata_sel: Test Data Out Select. - * '1' test_data_out[3:0] (PHY) register contents - * are output. '0' internaly generated signals are - * output. - * @taddr_in: Mode Address for Test Interface. - * Specifies the register address for writing to or - * reading from the PHY test interface register. - * @tdata_in: Internal Testing Register Input Data and Select - * This is a test bus. Data is present on [3:0], - * and its corresponding select (enable) is present - * on bits [7:4]. - * @ate_reset: Reset input from automatic test equipment. - * This is a test signal. When the USB Core is - * powered up (not in Susned Mode), an automatic - * tester can use this to disable phy_clock and - * free_clk, then re-eanable them with an aligned - * phase. - * '1': The phy_clk and free_clk outputs are - * disabled. "0": The phy_clock and free_clk outputs - * are available within a specific period after the - * de-assertion. - */ - struct cvmx_usbnx_usbp_ctl_status_cn50xx { - uint64_t txrisetune : 1; - uint64_t txvreftune : 4; - uint64_t txfslstune : 4; - uint64_t txhsxvtune : 2; - uint64_t sqrxtune : 3; - uint64_t compdistune : 3; - uint64_t otgtune : 3; - uint64_t otgdisable : 1; - uint64_t portreset : 1; - uint64_t drvvbus : 1; - uint64_t lsbist : 1; - uint64_t fsbist : 1; - uint64_t hsbist : 1; - uint64_t bist_done : 1; - uint64_t bist_err : 1; - uint64_t tdata_out : 4; - uint64_t reserved_31_31 : 1; - uint64_t txpreemphasistune : 1; - uint64_t dma_bmode : 1; - uint64_t usbc_end : 1; - uint64_t usbp_bist : 1; - uint64_t tclk : 1; - uint64_t dp_pulld : 1; - uint64_t dm_pulld : 1; - uint64_t hst_mode : 1; - uint64_t reserved_19_22 : 4; - uint64_t tx_bs_enh : 1; - uint64_t tx_bs_en : 1; - uint64_t loop_enb : 1; - uint64_t vtest_enb : 1; - uint64_t bist_enb : 1; - uint64_t tdata_sel : 1; - uint64_t taddr_in : 4; - uint64_t tdata_in : 8; - uint64_t ate_reset : 1; - } cn50xx; - /** - * struct cvmx_usbnx_usbp_ctl_status_cn52xx - * @txrisetune: HS Transmitter Rise/Fall Time Adjustment - * @txvreftune: HS DC Voltage Level Adjustment - * @txfslstune: FS/LS Source Impedence Adjustment - * @txhsxvtune: Transmitter High-Speed Crossover Adjustment - * @sqrxtune: Squelch Threshold Adjustment - * @compdistune: Disconnect Threshold Adjustment - * @otgtune: VBUS Valid Threshold Adjustment - * @otgdisable: OTG Block Disable - * @portreset: Per_Port Reset - * @drvvbus: Drive VBUS - * @lsbist: Low-Speed BIST Enable. - * @fsbist: Full-Speed BIST Enable. - * @hsbist: High-Speed BIST Enable. - * @bist_done: PHY Bist Done. - * Asserted at the end of the PHY BIST sequence. - * @bist_err: PHY Bist Error. - * Indicates an internal error was detected during - * the BIST sequence. - * @tdata_out: PHY Test Data Out. - * Presents either internaly generated signals or - * test register contents, based upon the value of - * test_data_out_sel. - * @siddq: Drives the USBP (USB-PHY) SIDDQ input. - * Normally should be set to zero. - * When customers have no intent to use USB PHY - * interface, they should: - * - still provide 3.3V to USB_VDD33, and - * - tie USB_REXT to 3.3V supply, and - * - set USBN*_USBP_CTL_STATUS[SIDDQ]=1 - * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable - * @dma_bmode: When set to 1 the L2C DMA address will be updated - * with byte-counts between packets. When set to 0 - * the L2C DMA address is incremented to the next - * 4-byte aligned address after adding byte-count. - * @usbc_end: Bigendian input to the USB Core. This should be - * set to '0' for operation. - * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP. - * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP. - * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D+ line. '1' pull down-resistance is connected - * to D+/ '0' pull down resistance is not connected - * to D+. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY. - * This signal enables the pull-down resistance on - * the D- line. '1' pull down-resistance is connected - * to D-. '0' pull down resistance is not connected - * to D-. When an A/B device is acting as a host - * (downstream-facing port), dp_pulldown and - * dm_pulldown are enabled. This must not toggle - * during normal opeartion. - * @hst_mode: When '0' the USB is acting as HOST, when '1' - * USB is acting as device. This field needs to be - * set while the USB is in reset. - * @tx_bs_enh: Transmit Bit Stuffing on [15:8]. - * Enables or disables bit stuffing on data[15:8] - * when bit-stuffing is enabled. - * @tx_bs_en: Transmit Bit Stuffing on [7:0]. - * Enables or disables bit stuffing on data[7:0] - * when bit-stuffing is enabled. - * @loop_enb: PHY Loopback Test Enable. - * '1': During data transmission the receive is - * enabled. - * '0': During data transmission the receive is - * disabled. - * Must be '0' for normal operation. - * @vtest_enb: Analog Test Pin Enable. - * '1' The PHY's analog_test pin is enabled for the - * input and output of applicable analog test signals. - * '0' THe analog_test pin is disabled. - * @bist_enb: Built-In Self Test Enable. - * Used to activate BIST in the PHY. - * @tdata_sel: Test Data Out Select. - * '1' test_data_out[3:0] (PHY) register contents - * are output. '0' internaly generated signals are - * output. - * @taddr_in: Mode Address for Test Interface. - * Specifies the register address for writing to or - * reading from the PHY test interface register. - * @tdata_in: Internal Testing Register Input Data and Select - * This is a test bus. Data is present on [3:0], - * and its corresponding select (enable) is present - * on bits [7:4]. - * @ate_reset: Reset input from automatic test equipment. - * This is a test signal. When the USB Core is - * powered up (not in Susned Mode), an automatic - * tester can use this to disable phy_clock and - * free_clk, then re-eanable them with an aligned - * phase. - * '1': The phy_clk and free_clk outputs are - * disabled. "0": The phy_clock and free_clk outputs - * are available within a specific period after the - * de-assertion. - */ - struct cvmx_usbnx_usbp_ctl_status_cn52xx { - uint64_t txrisetune : 1; - uint64_t txvreftune : 4; - uint64_t txfslstune : 4; - uint64_t txhsxvtune : 2; - uint64_t sqrxtune : 3; - uint64_t compdistune : 3; - uint64_t otgtune : 3; - uint64_t otgdisable : 1; - uint64_t portreset : 1; - uint64_t drvvbus : 1; - uint64_t lsbist : 1; - uint64_t fsbist : 1; - uint64_t hsbist : 1; - uint64_t bist_done : 1; - uint64_t bist_err : 1; - uint64_t tdata_out : 4; - uint64_t siddq : 1; - uint64_t txpreemphasistune : 1; - uint64_t dma_bmode : 1; - uint64_t usbc_end : 1; - uint64_t usbp_bist : 1; - uint64_t tclk : 1; - uint64_t dp_pulld : 1; - uint64_t dm_pulld : 1; - uint64_t hst_mode : 1; - uint64_t reserved_19_22 : 4; - uint64_t tx_bs_enh : 1; - uint64_t tx_bs_en : 1; - uint64_t loop_enb : 1; - uint64_t vtest_enb : 1; - uint64_t bist_enb : 1; - uint64_t tdata_sel : 1; - uint64_t taddr_in : 4; - uint64_t tdata_in : 8; - uint64_t ate_reset : 1; - } cn52xx; }; #endif