From: Joshua Lock <josh@linux.intel.com>
Date: Thu, 5 Nov 2009 15:50:21 +0000 (+0000)
Subject: tests: Remove a spurious #include
X-Git-Url: http://review.tizen.org/git/?a=commitdiff_plain;h=b9e519c3b2bc5fc01743568a2a37029c61fdf6ef;p=profile%2Fivi%2Fclutter.git

tests: Remove a spurious #include

The test-backface-culling has what looks like a stray #include in which
stops the test compiling for backends without GdkPixbuf. Remove it.

http://bugzilla.openedhand.com/show_bug.cgi?id=1867
---

diff --git a/tests/conform/test-backface-culling.c b/tests/conform/test-backface-culling.c
index af45d3c..ddae982 100644
--- a/tests/conform/test-backface-culling.c
+++ b/tests/conform/test-backface-culling.c
@@ -34,8 +34,6 @@ typedef struct _TestState
   CoglHandle offscreen_tex;
 } TestState;
 
-#include <gdk-pixbuf/gdk-pixbuf.h>
-
 static gboolean
 validate_part (int xnum, int ynum, gboolean shown)
 {