From: Ji-hoon Lee <dalton.lee@samsung.com>
Date: Thu, 20 Oct 2016 06:07:03 +0000 (+0900)
Subject: Fixed defect detected by static analysis tool
X-Git-Tag: accepted/tizen/common/20161020.173405~1
X-Git-Url: http://review.tizen.org/git/?a=commitdiff_plain;h=28ccc0b892605d09e5751cf24f3289aa20e2f638;p=platform%2Fcore%2Fuifw%2Fise-default.git

Fixed defect detected by static analysis tool

Change-Id: I035161483def1160fe3c58e91e9fe576ff75a94b
---

diff --git a/src/MicEffector.cpp b/src/MicEffector.cpp
index b4f235e..5f48e69 100644
--- a/src/MicEffector.cpp
+++ b/src/MicEffector.cpp
@@ -394,7 +394,8 @@ void MicEffector::VolumeCheck(bool fake)
         volumes = ieffect.GetVolume();
     } else {
         for (unsigned int i = 0; i < spectrum_count; i++) {
-            volumes.push_back(rand_r((unsigned int*)time(NULL)) % 2);
+            unsigned int seed = time(NULL);
+            volumes.push_back(rand_r(&seed) % 2);
         }
     }