tests: use namespacing for safepointer test names
authorMike Blumenkrantz <zmike@osg.samsung.com>
Fri, 30 Mar 2018 17:12:25 +0000 (13:12 -0400)
committerWonki Kim <wonki_.kim@samsung.com>
Tue, 10 Apr 2018 13:25:50 +0000 (22:25 +0900)
Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
src/tests/eina/eina_test_safepointer.c

index c5b2d83..152afd3 100644 (file)
@@ -30,7 +30,7 @@ static int test_array[128] = { 0, 1, 2, 3, 4, 5, 6, 7 };
 static int test_array2[64] = { 8, 9, 10, 11, 12, 13, 14 };
 static const void *pointers[EINA_C_ARRAY_LENGTH(test_array) + EINA_C_ARRAY_LENGTH(test_array2)] = { NULL };
 
-EFL_START_TEST(eina_test_reusable)
+EFL_START_TEST(eina_test_safepointer_reusable)
 {
    unsigned int i;
 
@@ -109,7 +109,7 @@ _thread2(void *data EINA_UNUSED, Eina_Thread t EINA_UNUSED)
    return NULL;
 }
 
-EFL_START_TEST(eina_test_threading)
+EFL_START_TEST(eina_test_safepointer_threading)
 {
    Eina_Thread t1, t2;
    unsigned int i;
@@ -147,7 +147,7 @@ EFL_START_TEST(eina_test_threading)
 }
 EFL_END_TEST
 
-EFL_START_TEST(eina_test_lowestbit)
+EFL_START_TEST(eina_test_safepointer_lowestbit)
 {
    unsigned int i;
 
@@ -175,7 +175,7 @@ EFL_END_TEST
 void
 eina_test_safepointer(TCase *tc)
 {
-   tcase_add_test(tc, eina_test_reusable);
-   tcase_add_test(tc, eina_test_threading);
-   tcase_add_test(tc, eina_test_lowestbit);
+   tcase_add_test(tc, eina_test_safepointer_reusable);
+   tcase_add_test(tc, eina_test_safepointer_threading);
+   tcase_add_test(tc, eina_test_safepointer_lowestbit);
 }