.debugfs_reg_access = adis_debugfs_reg_access,
};
-static const unsigned long adis16400_burst_scan_mask[] = {
- ~0UL,
- 0,
-};
-
static const char * const adis16400_status_error_msgs[] = {
[ADIS16400_DIAG_STAT_ZACCL_FAIL] = "Z-axis accelerometer self-test failure",
[ADIS16400_DIAG_STAT_YACCL_FAIL] = "Y-axis accelerometer self-test failure",
BIT(ADIS16400_DIAG_STAT_POWER_LOW),
};
+static void adis16400_setup_chan_mask(struct adis16400_state *st)
+{
+ const struct adis16400_chip_info *chip_info = st->variant;
+ unsigned i;
+
+ for (i = 0; i < chip_info->num_channels; i++) {
+ const struct iio_chan_spec *ch = &chip_info->channels[i];
+
+ if (ch->scan_index >= 0 &&
+ ch->scan_index != ADIS16400_SCAN_TIMESTAMP)
+ st->avail_scan_mask[0] |= BIT(ch->scan_index);
+ }
+}
+
static int adis16400_probe(struct spi_device *spi)
{
struct adis16400_state *st;
indio_dev->info = &adis16400_info;
indio_dev->modes = INDIO_DIRECT_MODE;
- if (!(st->variant->flags & ADIS16400_NO_BURST))
- indio_dev->available_scan_masks = adis16400_burst_scan_mask;
+ if (!(st->variant->flags & ADIS16400_NO_BURST)) {
+ adis16400_setup_chan_mask(st);
+ indio_dev->available_scan_masks = st->avail_scan_mask;
+ }
ret = adis_init(&st->adis, indio_dev, spi, &adis16400_data);
if (ret)