EFL: basic List tests
authorJoe Konno <joe.konno@intel.com>
Wed, 8 Aug 2012 21:48:55 +0000 (14:48 -0700)
committerJoe Konno <joe.konno@intel.com>
Wed, 8 Aug 2012 22:21:38 +0000 (15:21 -0700)
Signed-off-by: Joe Konno <joe.konno@intel.com>
src/efl/Makefile.am
src/efl/test_list.cpp [new file with mode: 0644]

index 32465da..6804a7e 100644 (file)
@@ -50,6 +50,7 @@ wayland_efl_test_SOURCES =            \
        test_icon.cpp                   \
        test_image.cpp                  \
        test_inwin.cpp                  \
+       test_list.cpp                   \
        test_window.cpp                 \
        ../testmain.cpp
 
diff --git a/src/efl/test_list.cpp b/src/efl/test_list.cpp
new file mode 100644 (file)
index 0000000..3a7e96c
--- /dev/null
@@ -0,0 +1,33 @@
+#include <vector>
+#include <string>
+
+#include "templates.h"
+
+class List : public EvasObject
+{
+public:
+       List(EvasObject &parent)
+               : EvasObject::EvasObject(elm_list_add(parent))
+       {
+
+       }
+};
+
+//TODO: more rigorous tests
+
+typedef ResizeObjectTest<List> ListResizeTest;
+typedef PositionObjectTest<List> ListPositionTest;
+typedef VisibleObjectTest<List> ListVisibilityTest;
+
+BOOST_AUTO_TEST_SUITE(EFL)
+
+       BOOST_AUTO_TEST_SUITE(List)
+
+               WAYLAND_ELM_HARNESS_TEST_CASE(ListResizeTest)
+               WAYLAND_ELM_HARNESS_TEST_CASE(ListPositionTest)
+               WAYLAND_ELM_HARNESS_TEST_CASE(ListVisibilityTest)
+
+       BOOST_AUTO_TEST_SUITE_END()
+
+BOOST_AUTO_TEST_SUITE_END()
+