Fix defects detected by static analysis tool 20/220220/1
authorJi-hoon Lee <dalton.lee@samsung.com>
Mon, 16 Dec 2019 07:32:51 +0000 (16:32 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Mon, 16 Dec 2019 07:32:51 +0000 (16:32 +0900)
Change-Id: Ia89e31faaaa995493715b0fb37db08f4048bdebb

src/e_mod_input_panel.c

index 9fb9717..7805637 100644 (file)
@@ -1412,7 +1412,7 @@ _ip_cb_e_buf_change(void *data EINA_UNUSED, int ev_type EINA_UNUSED, void *event
 
    EINA_LIST_FOREACH(g_input_panel->surfaces, l, ips)
      {
-        if (ips->ec != ev->ec) continue;
+        if (!ips || ips->ec != ev->ec) continue;
         _ips_client_frame_flush(ips);
      }