intel: Add a regression test for 2D decode, which I'm about to refactor.

diff --git a/intel/Makefile.am b/intel/Makefile.am
index 581c8c0..7225a78 100644 (file)
--- a/intel/Makefile.am
+++ b/intel/Makefile.am
@@ -62,6 +62,7 @@ BATCHES = \
        tests/gm45-3d.batch \
        tests/gen5-3d.batch \
        tests/gen6-3d.batch \
+       tests/gen7-2d-copy.batch \
        tests/gen7-3d.batch
 
 TESTS = \

diff --git a/intel/tests/gen7-2d-copy.batch b/intel/tests/gen7-2d-copy.batch
new file mode 100644 (file)
index 0000000..ce7fc29
Binary files /dev/null and b/intel/tests/gen7-2d-copy.batch differ

diff --git a/intel/tests/gen7-2d-copy.batch-ref.txt b/intel/tests/gen7-2d-copy.batch-ref.txt
new file mode 100644 (file)
index 0000000..0d621d3
--- /dev/null
+++ b/intel/tests/gen7-2d-copy.batch-ref.txt
@@ -0,0 +1,14 @@
+0x12300000:      0x54f08006: XY_SRC_COPY_BLT (rgb enabled, alpha enabled, src tile 1, dst tile 0)
+0x12300004:      0x03cc0190:    format 8888, pitch 400, rop 0xcc, clipping disabled,  
+0x12300008:      0x00000000:    dst (0,0)
+0x1230000c:      0x00640064:    dst (100,100)
+0x12300010:      0x122e9000:    dst offset 0x122e9000
+0x12300014:      0x00000000:    src (0,0)
+0x12300018:      0x00000080:    src pitch 128
+0x1230001c:      0x02ff1000:    src offset 0x02ff1000
+0x12300020:      0x13000002: MI_FLUSH_DW post_sync_op='no write' 
+0x12300024:      0x00000000:    address
+0x12300028:      0x00000000:    dword
+0x1230002c:      0x00000000:    upper dword
+0x12300030:      0x05000000: MI_BATCH_BUFFER_END
+0x12300034:      0x00000000:    

diff --git a/intel/tests/gen7-2d-copy.batch.sh b/intel/tests/gen7-2d-copy.batch.sh
new file mode 120000 (symlink)
index 0000000..796ca5f
--- /dev/null
+++ b/intel/tests/gen7-2d-copy.batch.sh
@@ -0,0 +1 @@
+test-batch.sh
\ No newline at end of file