[CodeGen] Fix typos to run tests. NFC.

llvm-svn: 371286

diff --git a/llvm/test/CodeGen/PowerPC/store-combine.ll b/llvm/test/CodeGen/PowerPC/store-combine.ll
index ed8f230..b168a8e 100644 (file)
--- a/llvm/test/CodeGen/PowerPC/store-combine.ll
+++ b/llvm/test/CodeGen/PowerPC/store-combine.ll
@@ -234,8 +234,8 @@ entry:
   %conv28 = trunc i64 %shr26 to i8
   store i8 %conv28, i8* %p, align 1
   ret void
-; CEHCK-PPC64LE: stdbrx [[REG2]], 0, 4
-; CEHCK-PPC64: stdx [[REG2]], 0, 4
+; CHECK-PPC64LE: stdbrx [[REG2]], 0, 4
+; CHECK-PPC64: stdx [[REG2]], 0, 4
 }
 
 ; One of the stores is volatile