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[CodeGen] Fix typos to run tests. NFC.
author
Xing GUO
<higuoxing@gmail.com>
Sat, 7 Sep 2019 04:57:53 +0000
(
04:57
+0000)
committer
Xing GUO
<higuoxing@gmail.com>
Sat, 7 Sep 2019 04:57:53 +0000
(
04:57
+0000)
llvm-svn: 371286
llvm/test/CodeGen/PowerPC/store-combine.ll
patch
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diff --git
a/llvm/test/CodeGen/PowerPC/store-combine.ll
b/llvm/test/CodeGen/PowerPC/store-combine.ll
index
ed8f230
..
b168a8e
100644
(file)
--- a/
llvm/test/CodeGen/PowerPC/store-combine.ll
+++ b/
llvm/test/CodeGen/PowerPC/store-combine.ll
@@
-234,8
+234,8
@@
entry:
%conv28 = trunc i64 %shr26 to i8
store i8 %conv28, i8* %p, align 1
ret void
-; C
EH
CK-PPC64LE: stdbrx [[REG2]], 0, 4
-; C
EH
CK-PPC64: stdx [[REG2]], 0, 4
+; C
HE
CK-PPC64LE: stdbrx [[REG2]], 0, 4
+; C
HE
CK-PPC64: stdx [[REG2]], 0, 4
}
; One of the stores is volatile