haltest: fix coverity defect 15/260415/1
authorYoungjae Cho <y0.cho@samsung.com>
Thu, 24 Jun 2021 08:11:00 +0000 (17:11 +0900)
committerYoungjae Cho <y0.cho@samsung.com>
Thu, 24 Jun 2021 08:12:54 +0000 (17:12 +0900)
Change-Id: Ibd8c6e0aec4f94f7f9d857635cb73161bb37b906
Signed-off-by: Youngjae Cho <y0.cho@samsung.com>
haltest/board.cpp

index 6062a81..4028b8e 100644 (file)
@@ -28,10 +28,9 @@ TEST_F(BOARD, GetDeviceSerialP)
                SKIP_MESSAGE("Not supported HAL");
                return;
        }
-       EXPECT_EQ(ret_val, 0) << "Failed to get device serial (" << ret_val << ")";
+       ASSERT_EQ(ret_val, 0) << "Failed to get device serial (" << ret_val << ")";
 
-       if (ret_val == 0 && serial)
-               DEBUG_MESSAGE("Serial=%s", serial);
+       DEBUG_MESSAGE("Serial=%s", serial);
 }
 
 TEST_F(BOARD, GetDeviceRevisionP)
@@ -44,8 +43,7 @@ TEST_F(BOARD, GetDeviceRevisionP)
                SKIP_MESSAGE("Not supported HAL");
                return;
        }
-       EXPECT_EQ(ret_val, 0) << "Failed to get device revision (" << ret_val << ")";
+       ASSERT_EQ(ret_val, 0) << "Failed to get device revision (" << ret_val << ")";
 
-       if (ret_val == 0)
-               DEBUG_MESSAGE("Revision=%d", revision);
+       DEBUG_MESSAGE("Revision=%d", revision);
 }