Reduce devices created in device_group tests

The device_group tests could sometimes hit timeouts on
slower CPUs. This change reduces the number of objects
created in these tests to match the reduced number used
in the device and instance tests.

Affects:
dEQP-VK.api.object_management.
	multithreaded_per_thread_resources.device_group
dEQP-VK.api.object_management.
	multithreaded_shared_resources.device_group

Components: Vulkan

VK-GL-CTS issue: 1512
Change-Id: Icb68643ff530a8b1a1a7daa9fc93d8db8bc5faf9

diff --git a/external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp b/external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp
index 6455734..0b2d661 100644 (file)
--- a/external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp
+++ b/external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp
@@ -2354,6 +2354,7 @@ template<typename Object> int getCreateCount                              (void) { return 100;    }
 // Creating VkDevice and VkInstance can take significantly longer than other object types
 template<>                                     int getCreateCount<Instance>    (void) { return 20;             }
 template<>                                     int getCreateCount<Device>              (void) { return 20;             }
+template<>                                     int getCreateCount<DeviceGroup> (void) { return 20;             }
 
 template<typename Object>
 class CreateThread : public ThreadGroupThread