The test is still failing and is a regression on master for
cris-elf: the remedy for (all) other targets wasn't
sufficient. I'm not myself going to put any effort into it
(debug-information being different enough for a test to
fail, is not a priority) and apparently not anyone else in
the last 5 years, so I'm just going to xfail it.
gcc/testsuite:
PR debug/66668
* gcc.dg/debug/dwarf2/stacked-qualified-types-3.c: xfail for cris-*-*
char * _Atomic i;
char * restrict j;
-/* { dg-final { scan-assembler-times "DIE \\(\[^\n\]*\\) DW_TAG_(?:const|volatile|atomic|restrict)_type" 8 } } */
+/* The xfail is due to PR66668. */
+/* { dg-final { scan-assembler-times "DIE \\(\[^\n\]*\\) DW_TAG_(?:const|volatile|atomic|restrict)_type" 8 { xfail cris-*-* } } } */