Reduce devices created in device_group tests
authorPeter Quayle <peter.quayle@imgtec.com>
Tue, 11 Dec 2018 18:02:26 +0000 (18:02 +0000)
committerYiwei Zhang <zzyiwei@google.com>
Fri, 25 Jan 2019 19:22:05 +0000 (14:22 -0500)
The device_group tests could sometimes hit timeouts on
slower CPUs. This change reduces the number of objects
created in these tests to match the reduced number used
in the device and instance tests.

Affects:
dEQP-VK.api.object_management.
multithreaded_per_thread_resources.device_group
dEQP-VK.api.object_management.
multithreaded_shared_resources.device_group

Components: Vulkan

VK-GL-CTS issue: 1512
Change-Id: Icb68643ff530a8b1a1a7daa9fc93d8db8bc5faf9
(cherry picked from commit 9134406c47a0f345ea9e3c67dc7b99c7947b2436)

external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp

index 05fbeeb..c5a99b1 100644 (file)
@@ -2410,6 +2410,7 @@ template<typename Object> int getCreateCount                              (void) { return 100;    }
 // Creating VkDevice and VkInstance can take significantly longer than other object types
 template<>                                     int getCreateCount<Instance>    (void) { return 20;             }
 template<>                                     int getCreateCount<Device>              (void) { return 20;             }
+template<>                                     int getCreateCount<DeviceGroup> (void) { return 20;             }
 
 template<typename Object>
 class CreateThread : public ThreadGroupThread