tools/testing/nvdimm: test get_config_size DSM failures

Add an nfit_test specific attribute for gating whether a get_config_size
DSM, or any DSM for that matter, succeeds or fails.  The get_config_size
DSM is initial motivation since that is the first command libnvdimm core
issues to determine the state of the namespace label area.

Signed-off-by: Dan Williams <dan.j.williams@intel.com>

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 99ea686..175fc24 100644 (file)
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -132,6 +132,8 @@ static u32 handle[NUM_DCR] = {
        [4] = NFIT_DIMM_HANDLE(0, 1, 0, 0, 0),
 };
 
+static unsigned long dimm_fail_cmd_flags[NUM_DCR];
+
 struct nfit_test {
        struct acpi_nfit_desc acpi_desc;
        struct platform_device pdev;
@@ -414,6 +416,9 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
                if (i >= ARRAY_SIZE(handle))
                        return -ENXIO;
 
+               if ((1 << func) & dimm_fail_cmd_flags[i])
+                       return -EIO;
+
                switch (func) {
                case ND_CMD_GET_CONFIG_SIZE:
                        rc = nfit_test_cmd_get_config_size(buf, buf_len);
@@ -582,6 +587,74 @@ static void put_dimms(void *data)
 
 static struct class *nfit_test_dimm;
 
+static int dimm_name_to_id(struct device *dev)
+{
+       int dimm;
+
+       if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1
+                       || dimm >= NUM_DCR || dimm < 0)
+               return -ENXIO;
+       return dimm;
+}
+
+
+static ssize_t handle_show(struct device *dev, struct device_attribute *attr,
+               char *buf)
+{
+       int dimm = dimm_name_to_id(dev);
+
+       if (dimm < 0)
+               return dimm;
+
+       return sprintf(buf, "%#x", handle[dimm]);
+}
+DEVICE_ATTR_RO(handle);
+
+static ssize_t fail_cmd_show(struct device *dev, struct device_attribute *attr,
+               char *buf)
+{
+       int dimm = dimm_name_to_id(dev);
+
+       if (dimm < 0)
+               return dimm;
+
+       return sprintf(buf, "%#lx\n", dimm_fail_cmd_flags[dimm]);
+}
+
+static ssize_t fail_cmd_store(struct device *dev, struct device_attribute *attr,
+               const char *buf, size_t size)
+{
+       int dimm = dimm_name_to_id(dev);
+       unsigned long val;
+       ssize_t rc;
+
+       if (dimm < 0)
+               return dimm;
+
+       rc = kstrtol(buf, 0, &val);
+       if (rc)
+               return rc;
+
+       dimm_fail_cmd_flags[dimm] = val;
+       return size;
+}
+static DEVICE_ATTR_RW(fail_cmd);
+
+static struct attribute *nfit_test_dimm_attributes[] = {
+       &dev_attr_fail_cmd.attr,
+       &dev_attr_handle.attr,
+       NULL,
+};
+
+static struct attribute_group nfit_test_dimm_attribute_group = {
+       .attrs = nfit_test_dimm_attributes,
+};
+
+static const struct attribute_group *nfit_test_dimm_attribute_groups[] = {
+       &nfit_test_dimm_attribute_group,
+       NULL,
+};
+
 static int nfit_test0_alloc(struct nfit_test *t)
 {
        size_t nfit_size = sizeof(struct acpi_nfit_system_address) * NUM_SPA
@@ -640,8 +713,10 @@ static int nfit_test0_alloc(struct nfit_test *t)
        if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev))
                return -ENOMEM;
        for (i = 0; i < NUM_DCR; i++) {
-               t->dimm_dev[i] = device_create(nfit_test_dimm, &t->pdev.dev, 0,
-                               NULL, "test_dimm%d", i);
+               t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
+                               &t->pdev.dev, 0, NULL,
+                               nfit_test_dimm_attribute_groups,
+                               "test_dimm%d", i);
                if (!t->dimm_dev[i])
                        return -ENOMEM;
        }