tools/mgmt-tester: add a exp feature to Read Exp Feature - Success
authorJoseph Hwang <josephsih@chromium.org>
Fri, 20 Aug 2021 05:18:02 +0000 (13:18 +0800)
committerAyush Garg <ayush.garg@samsung.com>
Fri, 11 Mar 2022 13:38:36 +0000 (19:08 +0530)
This patch adds a new quality report feature to the
"Read Exp Feature - Success" test.

Signed-off-by: Anuj Jain <anuj01.jain@samsung.com>
Signed-off-by: Ayush Garg <ayush.garg@samsung.com>
tools/mgmt-tester.c

index 8afd02c..da53e44 100755 (executable)
@@ -9334,7 +9334,7 @@ static const struct generic_data set_dev_flags_fail_3 = {
 };
 
 static const uint8_t read_exp_feat_param_success[] = {
-       0x02, 0x00,                             /* Feature Count */
+       0x03, 0x00,                             /* Feature Count */
        0xd6, 0x49, 0xb0, 0xd1, 0x28, 0xeb,     /* UUID - Simultaneous */
        0x27, 0x92, 0x96, 0x46, 0xc0, 0x42,     /* Central Peripheral */
        0xb5, 0x10, 0x1b, 0x67,
@@ -9343,6 +9343,10 @@ static const uint8_t read_exp_feat_param_success[] = {
        0xde, 0xb3, 0xea, 0x11, 0x73, 0xc2,
        0x48, 0xa1, 0xc0, 0x15,
        0x02, 0x00, 0x00, 0x00,                 /* Flags */
+       0x7f, 0x03, 0x14, 0x06, 0x6f, 0x9a,     /* UUID - Quality Report */
+       0x70, 0x93, 0x2d, 0x49, 0x06, 0x75,
+       0xbc, 0x59, 0x08, 0x33,
+       0x00, 0x00, 0x00, 0x00,                 /* Flags */
 };
 
 static const struct generic_data read_exp_feat_success = {