Fix memory leak in faultd_object_new unit test

Change-Id: Iffb32933e15aedfe6ce943f43e0fcc7e7adeddf8
Signed-off-by: Konrad Kuchciak <k.kuchciak@samsung.com>

diff --git a/tests/unit/faultd_object_tests.c b/tests/unit/faultd_object_tests.c
index 6d63f56b9517d4dfe25963249bcf7ad19ed51266..cad87408df60d3fddec0f0b2603eb007a8f7eab1 100644 (file)
--- a/tests/unit/faultd_object_tests.c
+++ b/tests/unit/faultd_object_tests.c
@@ -47,6 +47,7 @@ static void faultd_object_new_test(void **state)
        assert_null(obj->key);
 
        assert_true(list_empty(&obj->val.children));
+       *state = obj;
 }
 
 static void append_oid_test(void **state)