Fixed defect detected by static analysis tool 35/93035/1
authorJi-hoon Lee <dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:07:03 +0000 (15:07 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:07:17 +0000 (15:07 +0900)
Change-Id: I035161483def1160fe3c58e91e9fe576ff75a94b

src/MicEffector.cpp

index b4f235e..5f48e69 100644 (file)
@@ -394,7 +394,8 @@ void MicEffector::VolumeCheck(bool fake)
         volumes = ieffect.GetVolume();
     } else {
         for (unsigned int i = 0; i < spectrum_count; i++) {
-            volumes.push_back(rand_r((unsigned int*)time(NULL)) % 2);
+            unsigned int seed = time(NULL);
+            volumes.push_back(rand_r(&seed) % 2);
         }
     }