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Fixed defect detected by static analysis tool
35/93035/1
author
Ji-hoon Lee
<dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:07:03 +0000
(15:07 +0900)
committer
Ji-hoon Lee
<dalton.lee@samsung.com>
Thu, 20 Oct 2016 06:07:17 +0000
(15:07 +0900)
Change-Id: I035161483def1160fe3c58e91e9fe576ff75a94b
src/MicEffector.cpp
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diff --git
a/src/MicEffector.cpp
b/src/MicEffector.cpp
index
b4f235e
..
5f48e69
100644
(file)
--- a/
src/MicEffector.cpp
+++ b/
src/MicEffector.cpp
@@
-394,7
+394,8
@@
void MicEffector::VolumeCheck(bool fake)
volumes = ieffect.GetVolume();
} else {
for (unsigned int i = 0; i < spectrum_count; i++) {
- volumes.push_back(rand_r((unsigned int*)time(NULL)) % 2);
+ unsigned int seed = time(NULL);
+ volumes.push_back(rand_r(&seed) % 2);
}
}