tests/util: drop unused parameters

Signed-off-by: Eric Engestrom <eric.engestrom@imgtec.com>
Reviewed-by: Emil Velikov <emil.velikov@collabora.com>

diff --git a/tests/util/pattern.c b/tests/util/pattern.c
index 095eadf..2366b00 100644 (file)
--- a/tests/util/pattern.c
+++ b/tests/util/pattern.c
@@ -823,8 +823,8 @@ static void fill_tiles(const struct util_format_info *info, void *planes[3],
        }
 }
 
-static void fill_plain(const struct util_format_info *info, void *planes[3],
-                      unsigned int width, unsigned int height,
+static void fill_plain(void *planes[3],
+                      unsigned int height,
                       unsigned int stride)
 {
        memset(planes[0], 0x77, stride * height);
@@ -860,7 +860,7 @@ void util_fill_pattern(uint32_t format, enum util_fill_pattern pattern,
                return fill_smpte(info, planes, width, height, stride);
 
        case UTIL_PATTERN_PLAIN:
-               return fill_plain(info, planes, width, height, stride);
+               return fill_plain(planes, height, stride);
 
        default:
                printf("Error: unsupported test pattern %u.\n", pattern);