}
}
-/* Define some generic bad / good block scan pattern which are used
- * while scanning a device for factory marked good / bad blocks. */
-static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
-
-static struct nand_bbt_descr smallpage_memorybased = {
- .options = NAND_BBT_SCAN2NDPAGE,
- .offs = 5,
- .len = 1,
- .pattern = scan_ff_pattern
-};
-
static int __init mxcnd_probe(struct platform_device *pdev)
{
struct nand_chip *this;
goto escan;
}
- if (mtd->writesize == 2048) {
- host->pagesize_2k = 1;
- this->badblock_pattern = &smallpage_memorybased;
- }
+ host->pagesize_2k = (mtd->writesize == 2048) ? 1 : 0;
if (this->ecc.mode == NAND_ECC_HW) {
switch (mtd->oobsize) {