fix: fix invalid test logic 16/273916/1 sandbox/dh0128.kwak/add_testcase_20220415 accepted/tizen/unified/20220530.140619 submit/tizen/20220523.073623 submit/tizen/20220527.061958
authorDongHun Kwak <dh0128.kwak@samsung.com>
Fri, 15 Apr 2022 07:32:48 +0000 (16:32 +0900)
committerDongHun Kwak <dh0128.kwak@samsung.com>
Fri, 15 Apr 2022 07:32:48 +0000 (16:32 +0900)
commitb221f9fe395d44f3bed603924d93218e449d13a2
tree969a9655d5bef5fce2654061757d09a27a3cbc36
parent1a6815a3d83c9bd9422649af90108ef770266f81
fix: fix invalid test logic

- fix invalid test logic
  change i18n_utext_current32() to i18n_utext_next32() at utc_capi_base_utils_i18n_utext_next32_n
  change i18n_utext_current32() to i18n_utext_previous32 at
  utc_capi_base_utils_i18n_utext_previous32_n()

Change-Id: I06ef18d5bb53d727e477e8082d56221e9141617d
tests/utc-capi-base-utils-utext.c