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[NUI][Non-ACR] Fix TCT fail issue on VD target 95/192295/3 5.0_branch_out
authorhuiyu.eun <huiyu.eun@samsung.com>
Fri, 2 Nov 2018 05:21:14 +0000 (14:21 +0900)
committerhuiyu.eun <huiyu.eun@samsung.com>
Tue, 6 Nov 2018 00:18:32 +0000 (09:18 +0900)
commit2fbdef278a12e2f77ae083e2be725ea818a7cae7
tree2eaa614abff198b8cef64b3522b197a5b3cf908ctree | snapshot
parentde594f4a4f98975a1130a5690f7c87111971677fcommit | diff
[NUI][Non-ACR] Fix TCT fail issue on VD target

Change-Id: Ibf322892030aed6049e0ef143adca188930980fc
Signed-off-by: huiyu.eun <huiyu.eun@samsung.com>
tct-suite-vs/Tizen.NUI.Tests/testcase/TSInputMethodContext.cs diff | blob | history
Domain: Testing;