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[System.Usb][Non-ACR] Complement description for Tizen.Usb.Manual.Tests 81/257881/6
authorHyotaek Shim <hyotaek.shim@samsung.com>
Thu, 6 May 2021 01:24:17 +0000 (10:24 +0900)
committerHyotaek Shim <hyotaek.shim@samsung.com>
Thu, 6 May 2021 04:00:58 +0000 (04:00 +0000)
commitf204cc3329e5a714e7bc7a4bf75753847414566c
tree1bb1e81c7ccd61fef09f6a30597289bfa0295557tree | snapshot
parent8ee96dd79ee15064ae11ac4fccd28e4a6e31903dcommit | diff
[System.Usb][Non-ACR] Complement description for Tizen.Usb.Manual.Tests

Change-Id: I29dea20d8f34b9c90d6e6b638f15debf5034da4c
Signed-off-by: Hyotaek Shim <hyotaek.shim@samsung.com>
tct-suite-vs/Tizen.Usb.Manual.Tests/testcase/TSHotPluggedEventArgs.cs diff | blob | history
tct-suite-vs/Tizen.Usb.Manual.Tests/testcase/TSUsbManager.cs diff | blob | history
Domain: Testing;