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(parent: 1cf85d3) | patch
Improve overall 33/35533/1
authorMinJeong Kim <minjjj.kim@samsung.com>
Tue, 17 Feb 2015 07:38:37 +0000 (16:38 +0900)
committerMinJeong Kim <minjjj.kim@samsung.com>
Tue, 17 Feb 2015 08:01:21 +0000 (17:01 +0900)
commit5b8bf888f75768b105fb2cfe1f8e0fc13f104640
tree4b52d6f9c715ce7ed34a7b2630a213287e56c9cftree | snapshot
parent1cf85d34bec18ca77e707e6a330a6cd1c55a6b12commit | diff
Improve overall

 1. Re-numbering of test cases
 2. Added the util function
 3. Added transient_for test cases
 4. Some formatting
 5. Re-designed setup step

Change-Id: I820849e33e32cecc85dde346b373ef45656f4e87
Signed-off-by: MinJeong Kim <minjjj.kim@samsung.com>
19 files changed:
src/0001_basic.c [deleted file] blob | history
src/0001_basic.h [deleted file] blob | history
src/0001_introspect.c [new file with mode: 0644] blob
src/0002_basic_stack.c [deleted file] blob | history
src/0002_deregister.c [new file with mode: 0644] blob
src/0100_basic.c [new file with mode: 0644] blob
src/0100_basic.h [new file with mode: 0644] blob
src/0101_basic_stack.c [new file with mode: 0644] blob
src/0110_transient_for.c [new file with mode: 0644] blob
src/0110_transient_for.h [new file with mode: 0644] blob
src/0111_transient_for_raise.c [new file with mode: 0644] blob
src/0112_transient_for_lower.c [new file with mode: 0644] blob
src/0113_transient_for_stack_above.c [new file with mode: 0644] blob
src/0114_transient_for_stack_below.c [new file with mode: 0644] blob
src/Makefile.am diff | blob | history
src/e_test_case_main.c diff | blob | history
src/e_test_case_main.h diff | blob | history
src/e_test_case_util.c [new file with mode: 0644] blob
src/e_test_case_util.h [new file with mode: 0644] blob
Domain: Graphics System / Display Server;