Fixed a problem that NFC will not be turned on again if HAL test is 14/187314/2 accepted/tizen/unified/20180822.093911 accepted/tizen/unified/20180822.093926 submit/tizen/20180822.024801 submit/tizen/20180822.024818
authorsaerome.kim <saerome.kim@samsung.com>
Wed, 22 Aug 2018 02:36:36 +0000 (11:36 +0900)
committersaerome.kim <saerome.kim@samsung.com>
Wed, 22 Aug 2018 02:43:59 +0000 (11:43 +0900)
commit6a6d6ce3f86c94ecfcf16d3dd0552470a289ebcc
treef2e298b10365b8b50e458b7ec5a35a5e78e9e3a6
parent0eebcb65b04849c4bc4440561804ef3cfa19aa42
Fixed a problem that NFC will not be turned on again if HAL test is
executed.

If we call set_active very quickly, there is a phenomenon that the deinit
 thread in the NFC pluin is stopped  at pthread_join().
To overcome this, we added sleep(1) before calling set_active(false);

Change-Id: Iafbcbdf6742f8dbfbfef1d4be31cd40a67462e7f
Signed-off-by: saerome.kim <saerome.kim@samsung.com>
haltests/manager.cpp
haltests/nfcmgr.cpp