fdi_logger divided into positive and negative tests 00/230200/2
authorAgnieszka Baumann <a.baumann@samsung.com>
Mon, 30 Mar 2020 11:22:53 +0000 (13:22 +0200)
committerMichal Bloch <m.bloch@partner.samsung.com>
Tue, 14 Apr 2020 10:32:55 +0000 (10:32 +0000)
commitd7bd6a380bb7c079ceac155019140ce7a4f16c02
treee65166b10fdd6c945b6fbb3231c37e6c1f3eb05e
parent11e46cf9882630ae999edf7cfe56ab5b18848fc3
fdi_logger divided into positive and negative tests

Change-Id: I73c6729446d2025269c5517f4457fc68177fc4fa
Makefile.am
src/tests/fdi_logger_neg.c [new file with mode: 0644]
src/tests/fdi_logger_pos.c [new file with mode: 0644]
src/tests/fdi_logger_wrap.c [moved from src/tests/fdi_logger.c with 52% similarity]