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(parent: 44f3e30) | patch
[AArch64] Add negative tests for the SIMD & FP LDP instructions.
authorTilmann Scheller <t.scheller@samsung.com>
Tue, 15 Jul 2014 16:33:24 +0000 (16:33 +0000)
committerTilmann Scheller <t.scheller@samsung.com>
Tue, 15 Jul 2014 16:33:24 +0000 (16:33 +0000)
commitfc14cefeeade17a88822edd9d7ff2944067541c6
tree769142a334aba058a677fb7677c6b66e5fac8e42tree | snapshot
parent44f3e30cf24c01eb17c89009eed6c18aef567db5commit | diff
[AArch64] Add negative tests for the SIMD & FP LDP instructions.

LDP is unpredictable if the registers in the pair are identical, these tests check that we don't assemble instructions like that and error out instead.

llvm-svn: 213074
llvm/test/MC/AArch64/arm64-diags.s diff | blob | history
Domain: System / Toolchain;