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(parent: 8e59bac) | patch
Add positive and negative test cases for certsvc_certificate_dup_x509 and certsvc_cer... 84/314284/8
authorPhan Xuan Tan <xuan.tan@samsung.com>
Wed, 10 Jul 2024 02:06:16 +0000 (09:06 +0700)
committerDariusz Michaluk <d.michaluk@samsung.com>
Fri, 12 Jul 2024 11:22:23 +0000 (13:22 +0200)
commitfa1ad7adb53ef904a903a4ed398698c2e8f0d693
treefd9d55cccf55526c332a1dc96012b02facb230c4tree | snapshot
parent8e59bacb853dc8bca9e84ceca9d213634d027d54commit | diff
Add positive and negative test cases for certsvc_certificate_dup_x509 and certsvc_certificate_dup_pubkey_der

Change-Id: I1e430d71a01859b1fe08ec691abc63a7c1ab0206
unit-tests/test_vcore_api_cert.cpp diff | blob | history
Domain: Security / Authentication;