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(parent: 1c4b11c) | patch
test/test-mesh: Generate correct value for Device UUID
authorInga Stotland <inga.stotland@intel.com>
Fri, 12 Feb 2021 21:42:43 +0000 (13:42 -0800)
committerAyush Garg <ayush.garg@samsung.com>
Fri, 11 Mar 2022 13:38:34 +0000 (19:08 +0530)
commitf3bb46d9abf631a1785fd3e08fbd5f04b95b038e
tree1e88053d51f62b65bb98934f87a35680561d5babtree | snapshot
parent1c4b11c89c01d575a658d58c4f6a365543f173fecommit | diff
test/test-mesh: Generate correct value for Device UUID

This ensures that the value of Device UUID when invoking
Join method is compliant with RFC 4122.

Signed-off-by: Anuj Jain <anuj01.jain@samsung.com>
Signed-off-by: Ayush Garg <ayush.garg@samsung.com>
test/test-mesh diff | blob | history
Domain: Network & Connectivity / Bluetooth;