of/selftest: Test structure of device tree
authorGrant Likely <grant.likely@linaro.org>
Wed, 1 Oct 2014 16:40:22 +0000 (17:40 +0100)
committerGrant Likely <grant.likely@linaro.org>
Sat, 4 Oct 2014 20:20:13 +0000 (21:20 +0100)
commitf2051d6a88cd03f74221da887f56d778a1b2f1f1
tree9a50f845ed67fff6a37f801e8e3d1275b99a2520
parente66c98c7a0eacc33a9369a3ec086740044eb986c
of/selftest: Test structure of device tree

Add a testcase to verify that the device tree is properly constructed
and the lists are in a correct order. The new testcase gets run twice;
once after adding the testcase data, and once after removing it again.
It is run twice to make sure adding and removing the testcase data
doesn't corrupt the data structure.

Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Gaurav Minocha <gaurav.minocha.os@gmail.com>
drivers/of/selftest.c