projects / test / generic / wayland-fits.git / commit
? search:
summary | shortlog | log | commit | commitdiff | tree
(parent: 9e0e8ef) | patch
background: incorporate image option tests
authorJoe Konno <joe.konno@intel.com>
Wed, 20 Jun 2012 18:37:10 +0000 (11:37 -0700)
committerJoe Konno <joe.konno@intel.com>
Wed, 20 Jun 2012 18:37:10 +0000 (11:37 -0700)
commite5dadff85967623ec6ff5e7817dd8fa94931fa7f
tree049f7cfb2d0b6cafb307870e93107c8b412bd6e4tree | snapshot
parent9e0e8ef5275d8622f5edd6362d19c7d0001b59c4commit | diff
background: incorporate image option tests

Tiling, scaling, etc.

Signed-off-by: Joe Konno <joe.konno@intel.com>
src/efl/background.cpp diff | blob | history
src/efl/background.h diff | blob | history
src/efl/test_background.cpp diff | blob | history
Domain: Testing;