Latent defect issue solved in AS based on statistical analysis result

Latent defect issue solved in AS based on statistical analysis result

Change-Id: Ib80244e04a16354a31efb667126124daeb81896f
Signed-off-by: yeonghun.nam <yeonghun.nam@samsung.com>
Reviewed-on: https://gerrit.iotivity.org/gerrit/15179
Tested-by: jenkins-iotivity <jenkins-iotivity@opendaylight.org>
Reviewed-by: Jee Hyeok Kim <jihyeok13.kim@samsung.com>
(cherry picked from commit d39eed202efcd989dc4d971638b6e5713835c077)
Reviewed-on: https://gerrit.iotivity.org/gerrit/16089
Tested-by: jenkins-iotivity <jenkins@iotivity.org>