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(parent: 56e80b0) | patch
integration tests: Test loop device creation/teardown
authorMartin Pitt <martin.pitt@ubuntu.com>
Mon, 7 Nov 2011 06:06:13 +0000 (07:06 +0100)
committerMartin Pitt <martin.pitt@ubuntu.com>
Mon, 7 Nov 2011 06:06:13 +0000 (07:06 +0100)
commite34de77316129bb59cd0a02603f3946db8e0a5b0
treef636b4d46fbc9d945cbebf64b154edd20d347373tree | snapshot
parent56e80b0d1fb7651450b3942145415befefbfece5commit | diff
integration tests: Test loop device creation/teardown

Test in read/write and readonly modes.
src/tests/integration-test diff | blob | history
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