tests: increase step sizes for eina_fp_div and eina_fp_mul tests
authorMike Blumenkrantz <zmike@osg.samsung.com>
Fri, 30 Mar 2018 21:08:48 +0000 (17:08 -0400)
committerWonki Kim <wonki_.kim@samsung.com>
Tue, 10 Apr 2018 13:25:54 +0000 (22:25 +0900)
commite0744346c77d6d47ed79ae33994b54c88fa64ee7
treed8a56125ad475254b83900ab4e72083181862a31
parent01de0fd7d10ff2a1d846ad39b3d26d0d10cfcb6e
tests: increase step sizes for eina_fp_div and eina_fp_mul tests

fix T6841

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
src/tests/eina/eina_test_fp.c