test/test-mesh: Update to match modified APIs 65/229665/1
authorInga Stotland <inga.stotland@intel.com>
Fri, 27 Mar 2020 18:42:56 +0000 (11:42 -0700)
committerAnupam Roy <anupam.r@samsung.com>
Wed, 1 Apr 2020 20:50:57 +0000 (02:20 +0530)
commitde545fdacea92b7fcc8f25adcbe6eaba456c4804
treeab21334c139de2fbed2ab685b61ab98eeac21ffc
parent40e99a349114c138ae192e9c3184a39bda56792d
test/test-mesh: Update to match modified APIs

This handles updated parameter list in UnprovisionedScan(),
AddNode() and ScanResult() D-Bus methods

Change-Id: I9022a1aaf46f8609cc21f20864d5adbf223a32a2
Signed-off-by: Anupam Roy <anupam.r@samsung.com>
test/test-mesh