Fix test to use (and cleanup at) single exit 01/176801/3
authorIgor Kotrasinski <i.kotrasinsk@partner.samsung.com>
Mon, 16 Apr 2018 13:29:30 +0000 (15:29 +0200)
committerIgor Kotrasinski <i.kotrasinsk@partner.samsung.com>
Mon, 4 Jun 2018 10:06:23 +0000 (12:06 +0200)
commitdb7f56d31bf8a74f5efe4608570becb78ce12d8a
treea1d3eff096a4e8487eec07e4b06d270fc677de2b
parentb5e51709b77a0545d83e39ba63648f4b5bdd9dec
Fix test to use (and cleanup at) single exit

Change-Id: I9d49f17879c744c5d99a219d6825ef081b3f0e36
Signed-off-by: Igor Kotrasinski <i.kotrasinsk@partner.samsung.com>
TEECLib/src/teec_connection.c