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(parent: 82014ca) | patch
Eo tests: Fix bad free in eo_test_value
authorAvi Levin <avi.levin@samsung.com>
Mon, 12 Jan 2015 11:34:01 +0000 (13:34 +0200)
committerTom Hacohen <tom@stosb.com>
Mon, 12 Jan 2015 11:56:42 +0000 (11:56 +0000)
commitdad44a7100581ecc050271e9035c4f66dd2ed6ea
treec6ca52aa452b28b32ad4b0ca32b7d3e4a441fb78tree | snapshot
parent82014cad2c11b40e455e0578d22f09b04ebd1e5ccommit | diff
Eo tests: Fix bad free in eo_test_value

When running eo_test_suite we get an memory error: "double free or corruption".
That error arises because we try to free an Eina_Value value in eo_test_value
that doesn't need to freed.
I switched the eina_value_free to wina_value_flush, the proper way of
releasing it.

@fix
src/tests/eo/suite/eo_test_value.c diff | blob | history
Domain: UI Framework / EFL;