Test input attachments in random descriptor sets test group
authorRicardo Garcia <rgarcia@igalia.com>
Fri, 5 Jul 2019 09:44:54 +0000 (11:44 +0200)
committerAlexander Galazin <Alexander.Galazin@arm.com>
Fri, 9 Aug 2019 10:53:13 +0000 (06:53 -0400)
commitd59b53f2d42b0a820369f32ac278ee5a7be826d3
tree71a87cd34b71f51c1c2a030c4cea872c1d81e01e
parent9fadd149b3ad78195461a9e99c7e9e4067986396
Test input attachments in random descriptor sets test group

Add support for input attachments in the random descriptor sets tests
group. This will improve test coverage and allow us to test
vkUpdateDescriptorSetWithTemplate with
VK_DESCRIPTOR_TYPE_INPUT_ATTACHMENT, which is a case known to be missing
coverage.

Note: every descriptorset_random test will get a new component in its
name with several variants.

Affected tests:
dEQP-VK.binding_model.descriptorset_random.*

Components: Vulkan
VK-GL-CTS issue: 1869

Change-Id: I64ac976f24c291884e71aafb0c058a9340b584c1
android/cts/master/vk-master.txt
external/vulkancts/modules/vulkan/binding_model/vktBindingDescriptorSetRandomTests.cpp
external/vulkancts/mustpass/master/vk-default-no-waivers.txt
external/vulkancts/mustpass/master/vk-default.txt