Delete nodes allocated in unit test. (#1855)
authorDenis Maksimenko/AI Tools Lab /SRR/Assistant Engineer/삼성전자 <d.maksimenko@partner.samsung.com>
Mon, 15 Oct 2018 10:38:56 +0000 (13:38 +0300)
committerРоман Михайлович Русяев/AI Tools Lab /SRR/Staff Engineer/삼성전자 <r.rusyaev@samsung.com>
Mon, 15 Oct 2018 10:38:56 +0000 (13:38 +0300)
commitd54a6b36a7868e52f214e784c2306b647e8ec310
treeb01789aef74d369519d942518457e29e41f7dff5
parent21da40f566cc67ad587911c37e8acde3f35eb9b4
Delete nodes allocated in unit test. (#1855)

These nodes caused memory leaks detected by ASan and valgrind.

Signed-off-by: Denis Maksimenko <d.maksimenko@partner.samsung.com>
contrib/nnc/unittests/core/ir_node.cpp