VK_KHR_16bit_storage: granularity stress test
authorArkadiusz Sarwa <arkadiusz.sarwa@mobica.com>
Fri, 20 Oct 2017 10:47:28 +0000 (12:47 +0200)
committerAlexander Galazin <Alexander.Galazin@arm.com>
Mon, 11 Dec 2017 14:23:07 +0000 (09:23 -0500)
commitd3056800274f63b9d7edb6edfb53a4d1cf5672c6
treec14856b956a7caafe0141363fde04e6c6bb34d5e
parent86f11083a539b9e0d9386f776e045b8b6c77f477
VK_KHR_16bit_storage: granularity stress test

New tests:
dEQP-VK.spirv_assembly.instruction.compute.16bit_storage.uniform_16_to_16.stress_test

Components: Vulkan

VK-GL-CTS issue: 419

Change-Id: Id1a2d5d726e3fa293b07d9385d548fdfe071a681
android/cts/master/vk-master.txt
external/vulkancts/modules/vulkan/spirv_assembly/vktSpvAsm16bitStorageTests.cpp
external/vulkancts/modules/vulkan/spirv_assembly/vktSpvAsmComputeShaderCase.cpp
external/vulkancts/modules/vulkan/spirv_assembly/vktSpvAsmComputeShaderTestUtil.hpp
external/vulkancts/mustpass/1.1.0/vk-default.txt