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[RISC-V] Test TotalOrderIeee754ComparerTests: Fix NFloat - NaN testcases for RISC...
authorDenis Paranichev <48580269+denis-paranichev@users.noreply.github.com>
Thu, 1 Feb 2024 17:13:33 +0000 (20:13 +0300)
committerGleb Balykov/Advanced System SW Lab /SRR/Staff Engineer/Samsung Electronics <g.balykov@samsung.com>
Thu, 22 Feb 2024 11:52:55 +0000 (14:52 +0300)
commitcd20bb944fec9402764f58a5737cad12046a3457
treecb28bc22cd3f7c344b7bb93178d3d1f8809038actree | snapshot
parentf137a04fd83b0faae55739f0639c5ebca59c3652commit | diff
[RISC-V] Test TotalOrderIeee754ComparerTests: Fix NFloat - NaN testcases for RISC-V (#97340)

* Fix ieeeComparerTests NFloat NaN testcases for RISC-V

* Fix comment

* Specify test data for NaN test cases based on platform bitness

* Delete extra comment

* Fix CI failure

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Co-authored-by: d.paranichev <d.paranichev@partner.samsung.com>
src/libraries/System.Runtime/tests/System/Numerics/TotalOrderIeee754ComparerTests.cs diff | blob | history
Domain: Dotnet / Core;