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(parent: e7b53c4) | patch
[ARM GlobalISel] Remove redundant testcases. NFC
authorDiana Picus <diana.picus@linaro.org>
Wed, 25 Oct 2017 12:22:21 +0000 (12:22 +0000)
committerDiana Picus <diana.picus@linaro.org>
Wed, 25 Oct 2017 12:22:21 +0000 (12:22 +0000)
commitc537795433018594a0b2967d88f04f282e15153e
tree05813abb6d8623f7252adeee674b43ee67baa6c9tree | snapshot
parente7b53c45460a63782cf631dc4d77fea1d71fa4a3commit | diff
[ARM GlobalISel] Remove redundant testcases. NFC

Remove the G_FADD testcases from arm-legalizer.mir, they are covered by
arm-legalizer-fp.mir (I probably forgot to delete them when I created
that test).

llvm-svn: 316573
llvm/test/CodeGen/ARM/GlobalISel/arm-legalizer.mir diff | blob | history
Domain: System / Toolchain;